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Ā© 2026 Bookis AS

English

Scanning Electron Microscopy and X-Ray Microanalysis

Hardcover ā€¢ 2017 ā€¢ 1. edition

Scanning Electron Microscopy and X-Ray Microanalysis

By Nicholas W. M. Ritchie, Dale Newbury, David C. Joy, Joseph Michael, Joseph Goldstein, John Henry Scott

0 Ratings ā€¢ 0.0 of 5

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About the book

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practition...Show more

Book details

ISBN

9781493966745

Publisher

Springer-Verlag New York Inc.

Published year

2017

Language

Edition

1

Original title

Scanning Electron Microscopy and X-Ray Microanalysis

Format

Hardcover

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