Innbundet • 2017 • 1. utgave

Scanning Electron Microscopy and X-Ray Microanalysis

Name: Scanning Electron Microscopy and X-Ray Microanalysis
SKU: 9781493966745
Availability: OutOfStock
ISBN: 9781493966745

Av Nicholas W. M. Ritchie, Dale Newbury, David C. Joy, Joseph Michael, Joseph Goldstein, John Henry Scott

0 vurderinger • 0.0 av 5

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Om boken

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practition...Vis mer

Om boken

ISBN

9781493966745

Forlag

Springer-Verlag New York Inc.

Publiseringsår

2017

Språk

Utgave

Originaltittel

Scanning Electron Microscopy and X-Ray Microanalysis

Format

Innbundet

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