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English

Paperback • 2018 • 1. edition
By Zheng Wang, Anupam Chattopadhyay
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About the book
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in d...Show more
Book details
ISBN
9789811093210
Publisher
Springer Verlag, Singapore
Published year
2018
Language
Edition
1
Original title
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Format
Paperback
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